Case Study: Dynamic Reliability Models

Channel hot carrier (CHC) and bias-temperature instability (NBTI or PBTI) effects can significantly limit the operational lifetime of CMOS circuits.  Simulating the dynamic impact of these effects at the SPICE level via RelXpert, for example, has become increasingly important to ensuring the operation of advanced CMOS SoCs.  Logix supports the extraction of AgeMOS reliability model coefficients as well as custom user-defined reliability equation sets based on measured transistor degradation data.


* RelXpert and AgeMOS trademarks are properties of their respective owners.